An Integrated Probabilistic Model for Assessing a Nanocomponent's Reliability

DOI10.1239/JAP/1316796918zbMath1241.62142OpenAlexW1995194067MaRDI QIDQ3094697

Yarong Yang, Nader Ebrahimi

Publication date: 25 October 2011

Published in: Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1239/jap/1316796918

zbMATH Keywords

reliabilityGibbs distributionGibbs samplingassociated random variablesMarkov random fieldsconditionally increasing in sequence

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Applications of statistics to physics (62P35) Reliability and life testing (62N05)

Related Items (1)

Assessing the reliability of a nanocomponent using nanocrack growth

Cites Work

• Limiting results for arrays of binary random variables on rectangular lattices under sparseness conditions
• Assessing a Linear Nanosystem's Limiting Reliability from its Components
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