Implementing lifetime performance index of products with two-parameter exponential distribution

DOI10.1080/00207721.2010.494774zbMath1227.62114OpenAlexW2154890155MaRDI QIDQ3102829

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Publication date: 25 November 2011

Published in: International Journal of Systems Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207721.2010.494774

zbMATH Keywords

UMVUEcensored samplereliability testing

Mathematics Subject Classification ID

Censored data models (62N01) Applications of statistics in engineering and industry; control charts (62P30) Statistical tables (62Q05) Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)

Related Items (6)

Pareto analysis for the lifetime performance index of products on the basis of progressively first-failure-censored batches under balanced symmetric and asymmetric loss functions ⋮ Inference on the equality means of several two-parameter exponential distributions under progressively Type II censoring ⋮ Designing a repetitive group sampling plan for Weibull distributed processes ⋮ Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions ⋮ Computational testing algorithmic procedure of assessment for lifetime performance index of products with two-parameter exponential distribution based on the multiply type II censored sample ⋮ Statistical inference for the lifetime performance index based on generalised order statistics from exponential distribution

Uses Software

• IMSL Numerical Libraries
• Visual Fortran

Cites Work

• Unnamed Item
• Computational procedure of performance assessment of lifetime index of businesses for the Pareto lifetime model with the right type II censored sample
• The correct ``ball bearings data
• Computational testing algorithmic procedure of assessment for lifetime performance index of products with two-parameter exponential distribution
• Economic Order Quantity model with Weibull deterioration distribution, shortage and ramp-type demand
• An EOQ inventory model with time-varying demand and Weibull deterioration with shortages
• Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution
• A two-non-identical-unit parallel system with correlated lifetimes
• EOQ inventory model for items with Weibull distribution deterioration, time-varying demand and partial backlogging
• Approximate Fiducial Bounds on Reliability for the Two Parameter Negative Exponential Distribution
• Life Testing

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