Planning Accelerated Life Tests with Two or More Experimental Factors

DOI10.2307/1269733zbMath0862.62072OpenAlexW2067897024MaRDI QIDQ3125439

William Q. Meeker, Luis A. Escobar

Publication date: 3 June 1997

Full work available at URL: https://doi.org/10.2307/1269733

zbMATH Keywords

D-optimalitylognormal distributionc-optimalitytest planningtwo-factor accelerated life test experiments

Mathematics Subject Classification ID

Optimal statistical designs (62K05) Factorial statistical designs (62K15) Reliability and life testing (62N05)

Related Items (12)

THE MAXIMUM LIKELIHOOD ESTIMATES IN STEP PARTIALLY ACCELERATED LIFE TESTS FOR THE WEIBULL PARAMETERS IN CENSORED DATA ⋮ Estimation of Archival Lifetime Distribution for Writable Optical Disks from Accelerated Testings ⋮ Investigating design for survival models ⋮ Bayesian optimum accelerated life test plans based on quantile regression ⋮ Optimal progressive interval censoring plan under accelerated life test with limited budget ⋮ Reference optimality criterion for planning accelerated life testing ⋮ Inference for a progressive stress model from Weibull distribution under progressive type-II censoring ⋮ A penalized local D-optimality approach to design for accelerated test models ⋮ Planning accelerated life tests with random effects of test chambers ⋮ Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity ⋮ Analytical approach for designing accelerated degradation tests under an exponential dispersion model ⋮ Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

Uses Software

• AS 218

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