Equivalence of the tampered random variable and the tampered failure rate models in accelerated lifetesting for a class of life distributions having the ‘setting the clock back to zero property'

DOI10.1080/03610929208830805zbMath0800.62592OpenAlexW2026159212MaRDI QIDQ3135606

B. Raja Rao

Publication date: 11 October 1993

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610929208830805

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items

Conditions for the coincidence of the TFR, TRV and CE models ⋮ Multiple step-stress accelerated life test: the tampered failure rate model ⋮ Inferences in constant-partially accelerated life tests based on progressive type-II censoring ⋮ Estimation in step-stress partially accelerated life tests for the Burr type XII distribution using type I censoring ⋮ On exact inferential results for a simple step-stress model under a time constraint ⋮ On estimation of modified Weibull parameters in presence of accelerated life test

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