The Design of Truncated Sequential Test Plans Based on Attributes Data

DOI10.1081/SAC-200033306zbMath1101.62360MaRDI QIDQ3155631

Thomas P. McWilliams

Publication date: 17 January 2005

Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)

Mathematics Subject Classification ID

Sequential statistical analysis (62L10)

Related Items (1)

An innovative Bayesian sequential censored sampling inspection method and application to test design

Cites Work

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• Applications of the Direct Method in Sequential Analysis
• Optimum Character of the Sequential Probability Ratio Test

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