Automatic bubble defect inspection for microwave communication substrates using multi-threshold technique based co-occurrence matrix

DOI10.1080/00207540802680534zbMath1197.94163OpenAlexW2036350869MaRDI QIDQ3163348

Chien-Chih Wang, Bernard C. Jiang, Chien-Cheng Chu, Hsin-Ju Chen

Publication date: 25 October 2010

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540802680534

zbMATH Keywords

defect detection machine vision co-occurrence image subtraction

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10) Image processing (compression, reconstruction, etc.) in information and communication theory (94A08) Detection theory in information and communication theory (94A13)

Cites Work

Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques

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