Procedure of the convolution method for estimating production yield with sample size information
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Publication:3163707
DOI10.1080/00207540802552667zbMath1197.90109OpenAlexW1979912255MaRDI QIDQ3163707
Gu-Hong Lin, Ya Ching Cheng, Hui-Nien Hung, Wen Lea Pearn
Publication date: 26 October 2010
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00207540802552667
Cites Work
- The probability density function of process capability index Cpmk
- Distribution and moments in simplified form for a general class of capability indices
- Process capability indices for a regularly adjusted process
- Lower confidence bounds with sample size information for Cpm applied to production yield assurance
- Re-evaluating the process capability indices for non-normal distributions
- Combining process capability indices from a sequence of independent samples
- Brocess capability with asymmetric tolerances
- The asymptotic distribution of the process capability indexCpmk
- Estimating process yield based on Spk for multiple samples
- An alternative approach to test process capability for unilateral specification with subsamples
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