Characterization of a 3D defect using the expected improvement algorithm

DOI10.1108/03321640910958964zbMath1176.78042OpenAlexW2060092063MaRDI QIDQ3182809

Szabolcs Gyimóthy, Sándor Bilicz, József Pávó, Emmanuel Vazquez, Marc Lambert

Publication date: 16 October 2009

Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/b63bee1c832b19fb6877f4564ac3b3db1fc3cd30

zbMATH Keywords

stochastic processesoptimization techniquesmetalseddy currents

Mathematics Subject Classification ID

Stochastic programming (90C15) Numerical methods for inverse problems for integral equations (65R32) Electro- and magnetostatics (78A30) Optimization problems in optics and electromagnetic theory (78M50)

Cites Work

• An informational approach to the global optimization of expensive-to-evaluate functions
• Bayesian algorithms for one-dimensional global optimization
• Design and analysis of computer experiments. With comments and a rejoinder by the authors
• A taxonomy of global optimization methods based on response surfaces

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