Testing goodness of fit to the increasing failure rate family with censored data

DOI10.1002/nav.3800310412zbMath0554.62088OpenAlexW1988294613MaRDI QIDQ3217492

Robert F. Tenga, Thomas J. Santner

Publication date: 1984

Published in: Naval Research Logistics Quarterly (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.3800310412

zbMATH Keywords

exponential distributionrandom censoringgoodness of fitempirical total time on testincreasing failure rate familyunbiased against DFR alternativesempirical cumulative hazard functionhybrid of time and order statistic censored dataIFR populationKaplan-Meier empirical distributionorder statistic censored datatime censored data

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Reliability and life testing (62N05)

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