Design of universal test sequences for VLSI

DOI10.1109/TIT.1985.1057003zbMath0555.94021MaRDI QIDQ3220498

Abraham Lempel, Martin Cohn

Publication date: 1985

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Mathematics Subject Classification ID

Related Items (3)

Graphs with the unique path property: Structure, cycles, factors, and constructions ⋮ Exhaustive testing of almost all devices with outputs depending on limited number of inputs ⋮ The pseudorandom sequence of arrays

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