Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

DOI10.1515/amcs-2016-0045zbMath1347.93130OpenAlexW2525899694MaRDI QIDQ328909

Adrian Bilski, Jacek M. Wojciechowski

Publication date: 21 October 2016

Published in: International Journal of Applied Mathematics and Computer Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/amcs-2016-0045

zbMATH Keywords

tabu searchgenetic algorithmsupport vector machinecomplex analog systemsparametric fault detection

Mathematics Subject Classification ID

Approximation methods and heuristics in mathematical programming (90C59) Design techniques (robust design, computer-aided design, etc.) (93B51) Stochastic systems in control theory (general) (93E03)

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Cites Work

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• A unified decomposition approach for fault location in large analog circuits
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• An Introduction to Tabu Search
• A method for fault diagnosis in linear electronic circuits
• A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math

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