Random Pattern Testability

DOI10.1109/TC.1984.5009315zbMath0528.94025OpenAlexW2041753256MaRDI QIDQ3309621

Jacob Savir, Paul H. Bardell, Gary S. Ditlow

Publication date: 1984

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1984.5009315

zbMATH Keywords

fault detectiondetection probabilityfault coveragerandom patternssignal probabilityself test

Mathematics Subject Classification ID

Related Items

Pseudo-random test generation for large combinational circuits, Efficient VLSI fault simulation, Optimal periodic testing policy for circuit with self-testing