On Random Pattern Test Length
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Publication:3321982
DOI10.1109/TC.1984.1676470zbMath0536.94012OpenAlexW1827975329MaRDI QIDQ3321982
Publication date: 1984
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1984.1676470
fault detectionself-testnonmasking multiple faultstesting of large logic networks with random patterns
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GLOBAL: A design for random testability algorithm ⋮ Fault masking probabilities with single and multiple signature analysis ⋮ Pseudo-random test generation for large combinational circuits ⋮ Optimal periodic testing policy for circuit with self-testing
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