Functional Testing of Microprocessors

DOI10.1109/TC.1984.1676471zbMath0536.94013OpenAlexW2098076619MaRDI QIDQ3321984

Dhananjay Brahme, Jacob A. Abraham

Publication date: 1984

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1984.1676471

zbMATH Keywords

fault detectiontest generationreduced graphself-testfunctional level model for the microprocessor

Mathematics Subject Classification ID

Applications of graph theory to circuits and networks (94C15)

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