A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring

DOI10.2307/1268110zbMath0549.62067OpenAlexW4255498299MaRDI QIDQ3341722

William Q. Meeker

Publication date: 1984

Full work available at URL: https://doi.org/10.2307/1268110

zbMATH Keywords

robustnessreliabilitynumerical comparisonslognormal distributionscensored dataexperimental designaccelerated life testsWeibull distributionsoptimum testlarge sample properties of maximum likelihood estimators

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (11)

On minimax designs when there are two candidate models ⋮ Planning accelerated life tests with type II censored data ⋮ Accelerated life test planning with independent lognormal competing risks ⋮ Robust estimation based on one-shot device test data under log-normal lifetimes ⋮ Optimal design of accelerated degradation tests based on Wiener process models ⋮ Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals ⋮ Bayesian design for accelerated life testing ⋮ Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor ⋮ Equivalent accelerated life testing plans for log-location-scale distributions ⋮ Optimal design of accelerated life testing plans for periodical replacement with penalty ⋮ A dynamic bayesian approach to inference from accelerated life tests

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