Life distribution properties of devices subject to a pure jump damage process
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Publication:3347068
DOI10.2307/3213698zbMath0553.60077OpenAlexW2325557988MaRDI QIDQ3347068
Publication date: 1984
Published in: Journal of Applied Probability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/3213698
Reliability, availability, maintenance, inspection in operations research (90B25) Applications of renewal theory (reliability, demand theory, etc.) (60K10)
Related Items (7)
Unnamed Item ⋮ Optimal maintenance of systems subject to deterioration of the renewal type ⋮ Log concavity preservation by beta operator based on probability tools ⋮ Shock models with MIFRA time to failure distributions ⋮ Preservation of ageing classes in deterioration models with independent increments ⋮ Stability for multidimensional jump-diffusion processes ⋮ Optimal replacement and maintenance of systems subject to semi-Markov damage
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