Interval estimation from censored and masked system-failure data

DOI10.1109/24.85440zbMath0729.62614OpenAlexW2127968325MaRDI QIDQ3355106

Necip Doganaksoy

Publication date: 1991

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.85440

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (6)

Dependent masking and system life data analysis: Bayesian inference for two-component systems ⋮ Bayesian analysis of incomplete time and cause of failure data ⋮ STATISTICAL ANALYSIS OF SERIES SYSTEM FOR MASKED DATA UNDER SUCCESSIVE CENSORED LIFE TEST ⋮ Bayesian reliability modeling for masked system lifetime data ⋮ Approximate confidence interval for the new extreme value distribution ⋮ Maximum likelihood analysis of masked series system lifetime data

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