Setting defect charts control limits to balance cycle time and yield for a tandem production line

DOI10.1016/J.COR.2014.05.011zbMath1348.62270OpenAlexW2049368522MaRDI QIDQ337306

Liron Yedidsion, Miri Gilenson, Michael Hassoun

Publication date: 10 November 2016

Published in: Computers \& Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cor.2014.05.011

zbMATH Keywords

Markov chainsyieldsemiconductorsstatistical process controlqueuing theorycycle time

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Production models (90B30) Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Graphical methods in statistics (62A09)

Related Items (1)

On the importance of variability when managing metrology capacity

Cites Work

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• Exact Results for Shewhart Control Charts with Supplementary Runs Rules
• Approximate Analysis of General Queuing Networks by Decomposition
• An approach to the probability distribution of cusum run length
• Some inequalities for the queue GI/G/1
• Finding the convex hull of a simple polygon

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