Optimized allocation of defect inspection capacity with a dynamic sampling strategy

DOI10.1016/J.COR.2014.06.024zbMath1348.90216OpenAlexW2060138442MaRDI QIDQ337310

Gloria Luz Rodriguez-Verjan, Jacques Pinaton, Stéphane Dauzère-Pérès

Publication date: 10 November 2016

Published in: Computers \& Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cor.2014.06.024

zbMATH Keywords

linear programmingsemiconductor manufacturingcapacity planninginspectionswafers at risk

Mathematics Subject Classification ID

Linear programming (90C05) Reliability, availability, maintenance, inspection in operations research (90B25) Production models (90B30) Case-oriented studies in operations research (90B90)

Related Items (1)

On the importance of variability when managing metrology capacity

Cites Work

• Planning quality inspection operations in multistage manufacturing systems with inspection errors

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