scientific article

DOI10.3969/J.ISSN.0490-6756.2020.04.002zbMATH Open1463.65319MaRDI QIDQ3386265

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Publication date: 14 January 2021

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zbMATH Keywords

error estimateweak Galerkin finite element methodtime-dependent drift-diffusion model

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37) Laplace operator, Helmholtz equation (reduced wave equation), Poisson equation (35J05) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15) Electro- and magnetostatics (78A30) PDEs in connection with semiconductor devices (35Q81)

Related Items (6)

A weak Galerkin finite element method for 1D semiconductor device simulation models ⋮ Error Estimates for a Finite Element Method for the Drift-Diffusion Semiconductor Device Equations: The Zero Diffusion Case ⋮ Optimal \(L^2\) error estimates of stabilizer-free weak Galerkin finite element method for the drift-diffusion problem ⋮ Stabilizer-free weak Galerkin method and its optimal \(L^2\) error estimates for the time-dependent Poisson-Nernst-Planck problem ⋮ An HDG method for the time-dependent drift-diffusion model of semiconductor devices ⋮ Galerkin Approximation of Weak Solutions of the Drift Diffusion Model for Semiconductors Coupled with Maxwell's Equations

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