The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data

DOI10.1137/070711542zbMath1173.35741OpenAlexW2137456823MaRDI QIDQ3395054

Noam Zeev, Fioralba Cakoni

Publication date: 20 August 2009

Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/302077955c7a1c380ce404e3186dba81068097f8

zbMATH Keywords

electromagnetic scatteringlinear sampling methoddirect and inverse scatteringreciprocity gap functional methodscattering from cracksthin dielectric objects

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Electromagnetic theory (general) (78A25) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

Related Items (13)

Application of the linear sampling method to identify cracks with impedance boundary conditions ⋮ Application of the factorization method to retrieve a crack from near field data ⋮ The factorization method for the inverse scattering problem from thin dielectric objects ⋮ The mathematical basis of the inverse scattering problem for cracks from near-field data ⋮ Nondestructive testing of delaminated interfaces between two materials using electromagnetic interrogation ⋮ Inverse problems for anisotropic obstacle problems with multivalued convection and unbalanced growth ⋮ A spectral target signature for thin surfaces with higher order jump conditions ⋮ A modified transmission eigenvalue problem for scattering by a partially coated crack ⋮ The factorization method to reconstruct a combination of penetrable obstacle and arc ⋮ Modelling equation of electromagnetic scattering on thin dielectric structures ⋮ Nondestructive Testing of the Delaminated Interface between Two Materials ⋮ Qualitative Indicator Functions for Imaging Crack Networks Using Acoustic Waves ⋮ Mathematical analysis of scattering problems for partially coated obstacles and cracks

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