The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

DOI10.1080/00949650802142592zbMath1179.62146OpenAlexW2132622038MaRDI QIDQ3401367

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Publication date: 29 January 2010

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949650802142592

zbMATH Keywords

Markov chain Monte Carlo methodfailure rateexponential distributionscensoringposterior distributionsprior distributionsBayesian approachhigh reliabilitylife timeMetropolis-Hasting's alrogithm

Mathematics Subject Classification ID

Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30) Monte Carlo methods (65C05) Reliability and life testing (62N05)

Related Items (9)

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Cites Work

• Statistical decision theory and Bayesian analysis. 2nd ed
• comparing several accelerated life models
• Monte Carlo sampling methods using Markov chains and their applications
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