New RF extrinsic resistances extraction procedure for deep-submicron MOS transistors

DOI10.1002/JNM.726zbMath1183.78037OpenAlexW4247564242MaRDI QIDQ3406067

Jean-Pierre Raskin, J. C. Tinoco

Publication date: 12 February 2010

Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/jnm.726

zbMATH Keywords

series resistance extractionMosFets series resistancesRF extraction methods

Mathematics Subject Classification ID

Diffraction, scattering (78A45) Finite difference methods applied to problems in optics and electromagnetic theory (78M20) Analytic circuit theory (94C05)

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