Simulation of silicon semiconductor devices by means of a direct Boltzmann‐Poisson solver
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Publication:3425630
DOI10.1108/03321640610684114zbMath1121.78310OpenAlexW2070848295MaRDI QIDQ3425630
Publication date: 27 February 2007
Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1108/03321640610684114
Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Statistical mechanics of semiconductors (82D37) Motion of charged particles (78A35)
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Cites Work
- Efficient implementation of essentially nonoscillatory shock-capturing schemes
- Efficient implementation of essentially nonoscillatory shock-capturing schemes. II
- Weighted essentially non-oscillatory schemes
- A WENO-solver for the transients of Boltzmann-Poisson system for semiconductor devices: Performance and comparisons with Monte Carlo methods.
- Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic Scattering
- A finite difference scheme solving the Boltzmann-Poisson system for semiconductor devices
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