Reflectometry measuring refractive index and thickness of polymer samples simultaneously

DOI10.1080/09500340600654764zbMath1133.78331OpenAlexW2069221853MaRDI QIDQ3430707

Jianping Chen, Unnamed Author, Dongning Wang, Yiping Wang, Wei Jin, Xin-Wan Li

Publication date: 23 March 2007

Published in: Journal of Modern Optics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/09500340600654764

zbMATH Keywords

polymermeasurementreflectometryMichelson interference

Mathematics Subject Classification ID

Technical applications of optics and electromagnetic theory (78A55) Coherent states (81R30) Lasers, masers, optical bistability, nonlinear optics (78A60) Experimental work for problems pertaining to optics and electromagnetic theory (78-05)

This page was built for publication: Reflectometry measuring refractive index and thickness of polymer samples simultaneously