A new method for the detections of multiple faults using binary decision diagrams

DOI10.1007/BF02831913zbMath1120.68358MaRDI QIDQ3443357

Zhongliang Pan, Guangzhao Zhang, Ling Chen

Publication date: 1 June 2007

Published in: Wuhan University Journal of Natural Sciences (Search for Journal in Brave)

zbMATH Keywords

fault detectionbinary decision diagramsmultiple faultsdigital circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cites Work

• Multiple fault detection in parity checkers
• Multiple fault detection in fan-out free circuits using minimal single fault test set

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