scientific article

Publication date: 1988

Title: zbMATH Open Web Interface contents unavailable due to conflicting licenses.

automata testing fault tolerant systems error correcting circuits boolean functions switching circuits complexity of checking

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Research exposition (monographs, survey articles) pertaining to operations research and mathematical programming (90-02) Applications of renewal theory (reliability, demand theory, etc.) (60K10)

Related Items (24)

Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs ⋮ Estimations of the lengths of tests for logic gates in presence of many permissible faults ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Tests of contact closure for contact circuits ⋮ Lower estimate of the length of the complete test in the basis \(\{x|y \}\) ⋮ Short complete diagnostic tests for circuits with two additional inputs in some basis ⋮ Short tests of closures for contact circuits ⋮ Some classes of easily testable circuits in the Zhegalkin basis ⋮ Shannon function of the test length with respect to gate input identification ⋮ Short complete diagnostic tests for circuits implementing linear Boolean functions ⋮ On the exact value of the length of the minimal single diagnostic test for a particular class of circuits ⋮ LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates ⋮ A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS ⋮ On fault detection tests of contact break for contact circuits ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ On Partial Covers, Reducts and Decision Rules ⋮ Minimal complete fault detection tests for circuits of functional elements in standard basis ⋮ Unit checking output tests under constant faults for functional elements ⋮ Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates ⋮ Bounds on Shannon functions of lengths of contact closure tests for contact circuits ⋮ On diagnostic tests of contact break for contact circuits ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates

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