Detection of all single and multiple stuck-at faults in combinational digital circuits using index vector testing

DOI10.1080/00207729008910471zbMath0699.94014OpenAlexW2045468154MaRDI QIDQ3478364

Indranil Sen Gupta

Publication date: 1990

Published in: International Journal of Systems Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207729008910471

zbMATH Keywords

circuitssyndrome testingcombinational digitalindex vector testingsingle and multiple stuck-at faults

Mathematics Subject Classification ID

Cites Work

• Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
• Testing by Verifying Walsh Coefficients
• Syndrome-Testable Design of Combinational Circuits

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