Multistep fault-collapsing method for spectral signature detecting in combinational networks

DOI10.1080/00207219008921208zbMath0701.94019OpenAlexW1966231301WikidataQ126251762 ScholiaQ126251762MaRDI QIDQ3479981

Tong Wu, Yaosheng Zhang

Publication date: 1990

Published in: International Journal of Electronics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207219008921208

zbMATH Keywords

combinational networksmultiple stuck-at faultsfault maskfault relation treeinput redundant faultsWalsh spectral signature detecting methodweight increasing/decreasing faults

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• Spectral Fault Signatures for Internally Unate Combinational Networks
• Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
• Testing by Verifying Walsh Coefficients
• Spectral Signature Testing of Multiple Stuck-at Faults in Irredundant Combinational Networks
• A New Representation for Faults in Combinational Digital Circuits
• Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks

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