Uniform asymptotic error estimates for semiconductor device and electrochemistry equations

DOI10.1016/0362-546X(90)90019-DzbMath0702.34052OpenAlexW1992562215MaRDI QIDQ3480416

Fatiha Alabau-Boussouira

Publication date: 1990

Published in: Nonlinear Analysis: Theory, Methods & Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0362-546x(90)90019-d

zbMATH Keywords

Dirichlet conditionsjump discontinuitiesasymptotic error estimatessemiconductor device equationsInternal layers

Mathematics Subject Classification ID

Singular perturbations in context of PDEs (35B25) Biological applications of optics and electromagnetic theory (78A70) Asymptotic expansions of solutions to PDEs (35C20) Singular perturbations for ordinary differential equations (34E15) Electro- and magnetostatics (78A30)

Related Items (1)

A method for proving uniqueness theorems for the stationary semiconductor device and electrochemistry equations

Cites Work

• Unnamed Item
• Semilinear elliptic boundary value problems with small parameters
• A Singular Perturbation Analysis of the Fundamental Semiconductor Device Equations
• Asymptotic Analysis of Singular Singularly Perturbed Boundary Value Problems
• Uniform Asymptotic Representation of Solutions of the Basic Semiconductor-Device Equations
• Singular perturbation theory applied to the electrochemistry equations in the case of electroneutrality
• Equivalent Norms for Sobolev Spaces

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