Fast test generation for m-logic combinational circuits

DOI10.1080/00207218908925363zbMath0702.94022OpenAlexW2082951867MaRDI QIDQ3481653

Iwan Georgiew Tabakow

Publication date: 1989

Published in: International Journal of Electronics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207218908925363

zbMATH Keywords

fast test generation algorithmM-differencem-logic combinational circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

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