Design of test sequences for VLSI self-testing using LFSR

DOI10.1109/18.52485zbMath0704.94013OpenAlexW2149459130MaRDI QIDQ3484763

Henk D. L. Hollmann

Publication date: 1990

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/18.52485

zbMATH Keywords

maximum lengthlinear feedback shift registerVLSI self-testing

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Communication, information (94A99)

Related Items (2)

Proof of a conjecture and a bound on the imbalance properties of LFSR subsequences ⋮ The estimates of trigonometric sums and new bounds on a mean value, a sequence and a cryptographic function

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