Phase field modelling of stressed grain growth: analytical study and the effect of microstructural length scale
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Publication:348788
DOI10.1016/j.jcp.2013.12.022zbMath1349.82159OpenAlexW2073489145MaRDI QIDQ348788
Publication date: 5 December 2016
Published in: Journal of Computational Physics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jcp.2013.12.022
microstructural length scaleanalytical methodphase field modellingpolycrystalline microstructurestressed grain growth
Related Items
The numerical simulation of the phase field crystal (PFC) and modified phase field crystal (MPFC) models via global and local meshless methods, A multiscale coupled finite-element and phase-field framework to modeling stressed grain growth in polycrystalline thin films, A meshless technique based on generalized moving least squares combined with the second-order semi-implicit backward differential formula for numerically solving time-dependent phase field models on the spheres
Cites Work
- A multiscale Taylor model-based constitutive theory describing grain growth in polycrystalline cubic metals
- On anisotropic order parameter models for multi-phase systems and their sharp interface limits
- An introduction to continuum mechanics
- A MultiPhase Field Concept: Numerical Simulations of Moving Phase Boundaries and Multiple Junctions
- A generalized field method for multiphase transformations using interface fields
