A proportional hazards approach to correlate SiO/sub 2/-breakdown voltage and time distributions

DOI10.1109/24.55873zbMath0709.62670OpenAlexW1972444012MaRDI QIDQ3492946

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Publication date: 1990

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.55873

Mathematics Subject Classification ID

Statistics (62-XX)

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