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Technology scoring model considering rejected applicants and effect of reject inference

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Publication:3512382
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DOI10.1057/PALGRAVE.JORS.2602306zbMath1165.91348OpenAlexW2023805477MaRDI QIDQ3512382

So Young Sohn, Yoonseong Kim

Publication date: 11 July 2008

Published in: Journal of the Operational Research Society (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1057/palgrave.jors.2602306


zbMATH Keywords

bivariate probit modelreject inferencetechnology scoring


Mathematics Subject Classification ID

Decision theory (91B06)


Related Items (3)

Random effects model for credit rating transitions ⋮ Updating a credit-scoring model based on new attributes without realization of actual data ⋮ Support vector machines for default prediction of SMEs based on technology credit







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