A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length

DOI10.3103/S0027132212020064zbMath1296.94183MaRDI QIDQ355292

Dmitry S. Romanov

Publication date: 24 July 2013

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (1)

Single fault detection tests for circuits of functional elements

Cites Work

• Unnamed Item
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• Easily Testable Realizations ror Logic Functions

This page was built for publication: A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length