MEASUREMENT OF THE HARDNESS OF ULTRA-THIN FILMS BY THE FIRST DERIVATIVE OF LOAD-DISPLACEMENT CURVE FROM NANOINDENTATION DATA

DOI10.1142/S0217979210064198zbMath1423.74593MaRDI QIDQ3556850

Kai-Yang Zeng, Amit Kumar

Publication date: 26 April 2010

Published in: International Journal of Modern Physics B (Search for Journal in Brave)

zbMATH Keywords

thin filmshardnessnanoindentation

Mathematics Subject Classification ID

Experimental work for problems pertaining to mechanics of deformable solids (74-05) Thin films (74K35)

Cites Work

• The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile

This page was built for publication: MEASUREMENT OF THE HARDNESS OF ULTRA-THIN FILMS BY THE FIRST DERIVATIVE OF LOAD-DISPLACEMENT CURVE FROM NANOINDENTATION DATA