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Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric - MaRDI portal

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Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric

From MaRDI portal
Publication:3585578

DOI10.1002/JNM.750zbMATH Open1197.78043OpenAlexW4244807109MaRDI QIDQ3585578

Author name not available (Why is that?)

Publication date: 20 August 2010

Published in: (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/jnm.750



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