Simulation of femtosecond pulsed laser effects on MOS electronics using TCAD Sentaurus customized models
DOI10.1002/JNM.736zbMATH Open1197.78056OpenAlexW4231566864MaRDI QIDQ3585592
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Publication date: 20 August 2010
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.736
3D simulationmixed-mode simulationheavy ionfemtosecond pulsed lasersingle event effectTCAD Sentaurus
Boundary value problems for second-order elliptic equations (35J25) Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Statistical mechanics of semiconductors (82D37) Transport processes in time-dependent statistical mechanics (82C70) Lasers, masers, optical bistability, nonlinear optics (78A60)
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