Finite Element Solution of Optimal Control Problems Arising in Semiconductor Modeling
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Publication:3616825
DOI10.1007/978-3-540-78827-0_25zbMath1229.49028OpenAlexW2204341832MaRDI QIDQ3616825
Publication date: 26 March 2009
Published in: Large-Scale Scientific Computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/978-3-540-78827-0_25
Numerical optimization and variational techniques (65K10) Newton-type methods (49M15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Statistical mechanics of semiconductors (82D37)
Cites Work
- Unnamed Item
- Variational approximation of flux in conforming finite element methods for elliptic partial differential equations: a model problem
- The post-processing approach in the finite element method—part 1: Calculation of displacements, stresses and other higher derivatives of the displacements
- Mixed and Hybrid Finite Element Methods
- A Galerkin Procedure for Estimating the Flux for Two-Point Boundary Value Problems
- Fast Optimal Design of Semiconductor Devices
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