Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
DOI10.1108/03321640910918913zbMath1161.78303OpenAlexW1964588656MaRDI QIDQ3627389
Thomas Preisner, Michael Greiff, Wolfgang Mathis, Uzzal Binit Bala
Publication date: 12 May 2009
Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)
Full work available at URL: http://www.repo.uni-hannover.de/handle/123456789/2769
simulationfinite element analysiselectrostaticsnumerical analysisnanotechnologymeasuring instruments
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