Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing

DOI10.1109/TC.1983.1676202zbMath0513.94031OpenAlexW2049664543MaRDI QIDQ3659697

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Publication date: 1983

Published in: (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1983.1676202

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