Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing
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Publication:3659697
DOI10.1109/TC.1983.1676202zbMath0513.94031OpenAlexW2049664543MaRDI QIDQ3659697
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Publication date: 1983
Published in: (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1983.1676202
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