Confidence Interval Procedures for the Weibull Process with Applications to Reliability Growth
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Publication:3668694
DOI10.2307/1267580zbMath0519.62087OpenAlexW4238453328MaRDI QIDQ3668694
Publication date: 1982
Full work available at URL: https://doi.org/10.2307/1267580
tablesnonhomogeneous Poisson processreliability growthWeibull processfailure truncationtime truncationachieved MTBFDuane postulate
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