Optimal design of hazard-free and easily testable logic networks

DOI10.1080/00207728508926689zbMath0565.94024OpenAlexW2071172087MaRDI QIDQ3680758

Bidyut Gupta, Bhargab Bikram Bhattacharya

Publication date: 1985

Published in: International Journal of Systems Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207728508926689

zbMATH Keywords

fault detectioncontrol inputstest set generationsyndrome testinghazard-free combinational networks

Mathematics Subject Classification ID

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