Planning accelerated life tests with type II censored data

DOI10.1080/00949658608810881zbMath0599.62120OpenAlexW2095568595MaRDI QIDQ3734937

William Q. Meeker, Luis A. Escobar

Publication date: 1986

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949658608810881

zbMATH Keywords

reliabilityBLUEWeibull distributionlognormal distributionoptimum test planstype II censored samplesaccelerated life testslocation-scale distribution

Mathematics Subject Classification ID

Optimal statistical designs (62K05) Point estimation (62F10) Reliability and life testing (62N05)

Related Items (2)

Planning accelerated life tests for selecting the most reliable product ⋮ How do heterogeneities in operating environments affect field failure predictions and test planning?

Cites Work

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• On the Choice of Plotting Positions on Probability Paper
• Optimal Accelerated Life Designs for Estimation
• A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
• Confidence Limits for Weibull Regression With Censored Data
• Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
• Linear Estimation of a Regression Relationship from Censored Data: Part II Best Linear Unbiased Estimation and Theory
• Optimal Spacing and Weighting in Polynomial Prediction
• An efficient method for finding the minimum of a function of several variables without calculating derivatives
• Optimal Experimental Designs
• The Moments of Log-Weibull Order Statistics
• Design of Over-Stress Life-Test Experiments When Failure Times Have the Two-Parameter Weibull Distribution
• Locally Optimal Designs for Estimating Parameters

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