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zbMath0602.94018MaRDI QIDQ3739059

Zhongcheng Li, Yinghua Min

Publication date: 1986

Title: zbMATH Open Web Interface contents unavailable due to conflicting licenses.

zbMATH Keywords

test generation uniform sensitization

Mathematics Subject Classification ID

Related Items (4)

Why RTL ATPG? ⋮ A graph partitioning heuristic for the parallel pseudo-exhaustive logical test of VLSI combinational circuits ⋮ Easy test generation PLAs ⋮ Graph partitioning applied to the logic testing of combinational circuits

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