MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE

DOI10.1080/01969728608927428zbMath0603.94023OpenAlexW2119310068MaRDI QIDQ3741577

Wen-Ben Jone, Sunil R. Das

Publication date: 1986

Published in: Cybernetics and Systems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/01969728608927428

zbMATH Keywords

random testingsequential circuitsmultiple fault detectionmodified transition diagram

Mathematics Subject Classification ID

Cites Work

• Unnamed Item
• Minimal Detecting Transition Sequences: Application to Random Testing
• Analysis of Logic Circuits with Faults Using Input Signal Probabilities
• Probabilistic Treatment of General Combinational Networks
• Transition Count Testing of Combinational Logic Circuits
• The Error Latency of a Fault in a Sequential Digital Circuit
• A Continuous-Parameter Markov Model and Detection Procedures for Intermittent Faults

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