Spectral Signature Testing of Multiple Stuck-at Faults in Irredundant Combinational Networks

DOI10.1109/TC.1986.1676719zbMath0604.94013OpenAlexW2058273005MaRDI QIDQ3743250

J. C. Muzio, P. K. Lui

Publication date: 1986

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1986.1676719

zbMATH Keywords

fault detectionmultiple faultsTree networkssyndrome testingminimal spanning signaturemultiple- input faultsspectral signature testing

Mathematics Subject Classification ID

Related Items (2)

Multistep fault-collapsing method for spectral signature detecting in combinational networks ⋮ BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count

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