Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
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Publication:3747577
DOI10.2307/1269883zbMath0608.62125OpenAlexW2005810616MaRDI QIDQ3747577
Publication date: 1987
Full work available at URL: https://doi.org/10.2307/1269883
maximum likelihood estimationWeibull distributionlognormalsmallest extreme value distributiontime-to-failure distributionintegrated circuit reliabilitylaboratory life testslimited failure population
Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)
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