A QUALITATIVE ANALYSIS OF THE FUNDAMENTAL SEMICONDUCTOR DEVICE EQUATIONS
DOI10.1108/EB009978zbMath0619.65115OpenAlexW2058724619MaRDI QIDQ3756462
Publication date: 1983
Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1108/eb009978
matched asymptotic expansionsPoisson's equationboundary layersscalingelliptic systemssingular perturbation theoryfundamental static semiconductor device equationsnormed minimal Debye lengthoxide- semiconductor interfacesSchottky contacts
Singular perturbations in context of PDEs (35B25) Partial differential equations of mathematical physics and other areas of application (35Q99) Applications to the sciences (65Z05) Motion of charged particles (78A35)
Related Items (2)
Cites Work
This page was built for publication: A QUALITATIVE ANALYSIS OF THE FUNDAMENTAL SEMICONDUCTOR DEVICE EQUATIONS